bySampath Kumar, Sanjay Kr Singh, Arti Noor, D. S. Chauhan & B.K. Kaushik
A comparison of different sense amplifiers are presented in consideration of SRAM memories using 250nm and 180nm technology. The sensing delay-time for different capacitance values of the bit line and for different values of power supply results are given by considering worst case process corners and high temperatures. The effect of various design parameters on the different sense amplifiers has been discussed and reported. Topics: CMOS, SRAM, CTSA, CONV, CBL, DLT, IJAET, IJAET ARCHIVES, IJAET PAPERS, RESEARCH PAPERS, RESEARCH...
From the bitsavers.org collection, a scanned-in computer-related document. chi :: MTCHECK Listing Topics: dmes, bsi, sto, ldx, msg, rcpy, hrs, snse, oaao, stx, byte count, bsi bsi, status word, entry...